搜索包含 Tokyo International Symposium on Microcirculation (1981) 的图书 - 暨南大学图书馆

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	Digest of papers : 1973 symposium on semiconductor memory testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N. J. 0 索取号：TN304.07-53/E801/1973 作者：Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、出版社：New York : IEEE, c1973.		The shadow economy : an international survey 0 索取号：F0/E20042 作者：Schneider、 Friedrich.、Enste、 Dominik.、出版社：Cambridge ; New York : Cambridge University Press, 2002.
	Image science mathematics 0 索取号：TN27-53/E801 作者：Symposium on Current Mathematical Problems in Image Science (1976 : Monterey、 Calif.)、Wilde、 Carroll O.、Barrett、 Eamon.、出版社：North Hollywood, Calif. : Western Periodicals Co., 1977.		The accuracy of flow measurements by laser doppler methods : proceedings of the LDA-Symposium Copenhagen, 1975 0 索取号：TN249-53/E805/1975 作者：LDA-Symposium、 Technical University of Denmark、 1975.、Buchhave、 Preben.、Copenhagen. Polyteknisk l´reanstalt.、出版社：Skovlunde : Proceedings LDA-Symposium Copenhagen 1975, 1976.
	Proceedings of the International Conference on Lasers '82, New Orleans, Louisiana, December 13-17, 1982 0 索取号：TN24-53/E909/1982 作者：International Conference on Lasers (1982 : New Orleans、 La.)、Powell、 Richard C. (Richard Conger)、 1939-、Society for Optical & Quantum Electronics.、出版社：McLean, VA : STS Press, 1982 [i.e. 1983].		Digest of technical papers : XIV International Conference on Quantum Electronics, 9-13 June 1986, San Francisco, California 0 索取号：TN201-53/E901/14 作者：International Quantum Electronics Conference (14th : 1986 : San Francisco、 Calif.)、American Physical Society.、Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers)、Optical Society of America.、出版社：[Washington, D.C.] : Optical Society of America, 1986.
	Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971 0 索取号：TN14-53/E801/11 作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、出版社：San Francisco, Calif. : San Francisco Press, c1971.		Record of the 10th symposium on electron, ion, and laser beam technology 0 索取号：TN14-53/E801/10 作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、出版社：San Francisco : San Francisco Press, [c1969].
	Proceedings 0 索取号：TN1-53/E906 作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984		1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.
	Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.		Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
	Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.		Statistical sampling : past, present, and future theoretical and practical 0 索取号：作者：Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、出版社：Philadelphia, PA : ASTM, c1990.
	Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico 0 索取号：TN1-53/E805 作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.		1975 IEEE MTT-S International Microwave Symposium : digest of technical papers 0 索取号：TN019.2-7/E801/1975 作者：IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、出版社：Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975

	Digest of papers : 1973 symposium on semiconductor memory testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N. J. 0 索取号：TN304.07-53/E801/1973 作者：Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、出版社：New York : IEEE, c1973.		The shadow economy : an international survey 0 索取号：F0/E20042 作者：Schneider、 Friedrich.、Enste、 Dominik.、出版社：Cambridge ; New York : Cambridge University Press, 2002.
	Image science mathematics 0 索取号：TN27-53/E801 作者：Symposium on Current Mathematical Problems in Image Science (1976 : Monterey、 Calif.)、Wilde、 Carroll O.、Barrett、 Eamon.、出版社：North Hollywood, Calif. : Western Periodicals Co., 1977.		The accuracy of flow measurements by laser doppler methods : proceedings of the LDA-Symposium Copenhagen, 1975 0 索取号：TN249-53/E805/1975 作者：LDA-Symposium、 Technical University of Denmark、 1975.、Buchhave、 Preben.、Copenhagen. Polyteknisk l´reanstalt.、出版社：Skovlunde : Proceedings LDA-Symposium Copenhagen 1975, 1976.
	Proceedings of the International Conference on Lasers '82, New Orleans, Louisiana, December 13-17, 1982 0 索取号：TN24-53/E909/1982 作者：International Conference on Lasers (1982 : New Orleans、 La.)、Powell、 Richard C. (Richard Conger)、 1939-、Society for Optical & Quantum Electronics.、出版社：McLean, VA : STS Press, 1982 [i.e. 1983].		Digest of technical papers : XIV International Conference on Quantum Electronics, 9-13 June 1986, San Francisco, California 0 索取号：TN201-53/E901/14 作者：International Quantum Electronics Conference (14th : 1986 : San Francisco、 Calif.)、American Physical Society.、Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers)、Optical Society of America.、出版社：[Washington, D.C.] : Optical Society of America, 1986.
	Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971 0 索取号：TN14-53/E801/11 作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、出版社：San Francisco, Calif. : San Francisco Press, c1971.		Record of the 10th symposium on electron, ion, and laser beam technology 0 索取号：TN14-53/E801/10 作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、出版社：San Francisco : San Francisco Press, [c1969].
	Proceedings 0 索取号：TN1-53/E906 作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984		1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.
	Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.		Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
	Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.		Statistical sampling : past, present, and future theoretical and practical 0 索取号：作者：Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、出版社：Philadelphia, PA : ASTM, c1990.
	Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico 0 索取号：TN1-53/E805 作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.		1975 IEEE MTT-S International Microwave Symposium : digest of technical papers 0 索取号：TN019.2-7/E801/1975 作者：IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、出版社：Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975